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Results of iSYSTEMs SMPO Survey: "Should every software developer do Unit Testing?"

Here are the results of iSYSTEMs poll:
66,7% answered "yes, every developer should do unit testing".
25,0% said "no".
8,3% don´t know...
This result reflects a trend for embedded software development.

Most of the developers know about the benefits of unit testing:
- test as much and as early as possible in the development process. The earlier the cheaper to fix a bug.
- test a single function without having implemented/or having access to all code
- proove that a function behaves according to the specification/requirements
- proove that there is no dead code (code coverage)
- build a certain set of tests (test know-how) for regression testing if the function code has changed
- ...

However, most of them don't do it because:
- in most cases an additional tool is necessary
- it is very time consuming because of additional compile-link-download-execute cycles
- traditional unit test tools instrument the code to
 * generate a test harness for a single function
 * measure code coverage (e.g., to measure the execution of every single statement and/or decision)
- it is not the orginal code
- ...

So, this rises a big challenge for tool vendors such as iSYSTEM. In Q3/2009 iSYSTEM will publish a new
version of isystem.connect with an add-on for unit testing. Stay tuned!

iSYSTEM shows "Mini"-HIL solution at NI VIP October 7, 2009 in Fuerstenfeldbruck (Germany)

In the year 2010 an embedded software development and test workplace could look like this:
In addition to a software development tool that would be a debugger with or without trace support, a stimulation hardware for the target system is used (e.g., sbRIO from National Instruments as a mini-HIL).

Thus, a developer may drive a lot of function tests already while developing software. All is done in a single tool environment that is as close as possible to the real hardware (and real-time) as well as in an early stage of the development and test process.

The connection between NI's sbRIO platform to iSYSTEM tools is realised using iSYSTEM's open API isystem.connect. This generic interface also includes a free LabVIEW VI library to drive the described test approach from within LabVIEW.

This Week´s Workshop: Boundary Scan meets Microcontroller Emulation

This week, October 1, 2009 the technology partners GÖPEL and iSYSTEM offer a free workshop: "Boundary Scan meets Microcontroller Emulation". 

To cope with challenges of future hardware components tests, boundary scan and JTAG emulation must be combined. Boundary Scan and JTAG emulation are two methods that complement each other perfectly.

The workshop takes place October 1, 2009 from 10:00am to 4:00pm at iSYSTEM AG, Carl-Zeiss-Str. 1, 85247 Schwabhausen (close to Munich).

For detailed information on the workshop see this whitepaper.

If you like to participate in this Workshop, please contact us

iSYSTEM Company and Products - Why iSYSTEM?

Free Download of iSYSTEM's brand new and detailed

• Company and Product Overview +
• "Fighting" Guide (Feature-Benefit Analysis)

White Paper - Combining Boundary Scan and JTAG Emulation

Combining Boundary Scan and JTAG Emulation for Advanced Structural Test and Diagnostics

 

Boundary Scan and JTAG Emulation are two perfectly complementary methods, which are fused into one structural test by GOEPEL electronic’s VarioTAP ...

Download GOEPEL electronic GmbH White Paper

Get the agenda of the first official workshop about this technology October 1, 2009 @ iSYSTEM AG, Schwabhausen Germany